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Si4355
Table 4. Receiver AC Electrical Characteristics 1 (Continued)
Parameter
BER Variation vs Power
Level 2
RSSI Resolution
Symbol
P RX_RES
RES RSSI
Conditions
Up to +5 dBm Input Level
Min
—
—
Typ
0
±0.5
Max
0.1
—
Units
ppm
dB
? 1-Ch Offset
Selectivity 2
C/I 1-CH
Desired Ref Signal 3 dB above sensitiv-
—
–56
—
dB
? 2-Ch Offset Selectivity
2
C/I 2-CH
ity, BER < 0.1%. Interferer is CW and
desired modulated with
1.2 kbps ? F = 5.2 kHz GFSK with
—
–59
—
dB
BT = 0.5,
Rx BW = 58 kHz,
channel spacing = 100 kHz
Blocking 200 kHz–1 MHz
200K BLOCK Desired Ref Signal 3 dB above sensitiv-
—
–58
—
dB
Blocking 1 MHz Offset 2
Blocking 8 MHz Offset 2
1M BLOCK
8M BLOCK
ity, BER < 0.1% Interferer is CW and
desired modulated with 1.2 kbps
? F = 5.2 kHz GFSK with BT = 0.5,
—
—
–61
–79
—
—
dB
dB
RX BW = 58 kHz
Image Rejection 2
Im REJ
Rejection at the image frequency.
—
–40
—
dB
IF = 468 kHz
Spurious Emissions 2
P OB_RX1
Measured at RX pins
—
—
–54
dBm
Notes:
1. All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 9.
2. Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" section in "1.1.
Definition of Test Conditions" on page 9.
Table 5. Auxiliary Block Specifications 1
Parameter
XTAL Range 2
Symbol
XTAL-
Conditions
Min
25
Typ
—
Max
32
Units
MHz
RANGE
30 MHz XTAL Start-Up Time
t 30M
Using XTAL and board layout in
—
250
—
μs
reference design. Start-up time
will vary with XTAL type and
board layout
30 MHz XTAL Cap
Resolution 3
POR Reset Time
30M RES
t POR
—
—
70
—
—
5
fF
ms
Notes:
1. All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 9.
2. XTAL Range tested in production using an external clock source (similar to using a TCXO).
3. Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" section in "1.1.
Definition of Test Conditions" on page 9.
6
Rev 1.0
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